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HD6433713 Datasheet(PDF) 107 Page - Renesas Technology Corp |
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HD6433713 Datasheet(HTML) 107 Page - Renesas Technology Corp |
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107 / 324 page  4.3.3 Reliability of Written Data An effective way to assure the data holding characteristics of the programmed chips is to bake them at 150˚C, then screen them for data errors. This procedure quickly eliminates chips with PROM memory cells prone to early data retention failure. Figure 4-8 shows a flow chart of this screening procedure. Figure 4-6 Recommended Screening Procedure If write errors occur repeatedly while the same PROM programmer is being used, stop programming and check for problems in the PROM programmer and socket adapter, etc. Please notify your Hitachi representative of any problems occurring during programming or in screening after high-temperature baking. Install Write program and verify written data Bake chips with power off 150 C ± 10 C, 48 Hr Read and check program V = 4.5 V and 5.5 V Note: * Baking time is measured from when the oven reaches 150°C. +8 Hr –0 Hr °° CC * 96 |
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