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HD6433713 Datasheet(PDF) 106 Page - Renesas Technology Corp |
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HD6433713 Datasheet(HTML) 106 Page - Renesas Technology Corp |
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106 / 324 page  3. Avoid touching the socket adapter or chip during programming, since this may cause contact faults and write errors. 4. Some commercially available EPROM programmers execute a device test before writing, reading, or verifying. The device test is a leakage test of the EPROM pins or ZTAT microcontroller pins. (A ZTAT microcontroller is a microcontroller with on-chip EPROM.) The function of this test is to check whether the device is correctly inserted in the socket, by confirming that leakage current flow is above a certain minimum level. In devices like the H8/3714 in which the on-chip EPROM is assigned to high-voltage pins (PMOS open-drain pins), no leakage current flows in the sink direction. That may cause the device test to fail and prevent writing, reading, or verifying. If this occurs, switch the device test off. Note that in some EPROM programmers, the device test cannot be switched off. 95 |
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