BT8376EPF datasheet(27/323 Pages) CONEXANT

27 / 323 page

Bt8370/8375/8376

1.0 Pin Descriptions

Fully Integrated T1/E1 Framer and Line Interface

1.1 Pin Assignments

N8370DSE

Conexant

1-11

Clock Rate Adapter (CLAD)

CLADI

CLAD Input

Optional CLAD input timing reference used to phase lock CLADO and JCLK

outputs to 1 of 44 different input clock frequencies selected in the range of

8 kHz to 16384 kHz (see [CLAD registers; addr 090–092]).

REFCKI

Reference Clock

System must apply a 10 MHz

±50 ppm clock signal to act as frequency

reference for internal Numerical Controlled Oscillator (NCO). REFCKI

determines frequency accuracy and stability of CLADO and jitter attenuator

(JCLK) clocks when the NCO operates in free running mode (see [JFREE;

addr 002]).

REFCKI is the baseband reference for all CLAD/JAT functions and is used

internally to generate clocks of various frequencies, locked to a selected

receive, transmit, or external clock. Hence, REFCKI is always required.

CLADO

CLAD Output

CLADO is configured to operate at 1 of 14 different clock frequencies (see

[CSEL; addr 091]) that include T1, E1 or system bus rates. CLADO is

typically programmed to supply RSB and TSB clocks that are

phase-locked to the selected transmit, receive or CLADI timing reference

(see [JEN; addr 002 and CEN; addr 090]). On the Bt8376 device, CLAD0

drives low when enabled.

Test Access

TDI

JTAG Test Data Input

Test data input per

IEEE Std 1149.1-1990. Used for loading all serial

instructions and data into internal test logic. Sampled on the rising edge of

TCK. TDI can be left unconnected if it is not being used because it is pulled

up internally.

TMS

JTAG Test mode

Select

Active-low test mode select input per

IEEE Std 1149.1-1990. Internally

pulled-up input signal used to control the test-logic state machine.

Sampled on the rising edge of TCK. TMS can be left unconnected if it is

not being used because it is pulled up internally.

TDO

JTAG Test Data

Output

Test data output per

IEEE Std 1149.1-1990. Three-state output used for

reading all serial configuration and test data from internal test logic.

Updated on the falling edge of TCK.

TCK

JTAG Test Clock

Test clock input per IEEE Std 1149.1-1990. Used for all test interface and

internal test-logic operations. If unused, TCK must be pulled low.

Power Supply

VDD[6:0]

Power

+5 VDC

±5%

GND[6:0]

Ground

0 VDC

NOTE(S):

1. I = Input, O = Output

2. PIO = Programmable I/O; controls located at address 018.

3. Multiple signal names show mutually exclusive pin functions.

4. All output pins power up in the high-impedance state within 3,000 cycles of the applied REFCKI (see POE; addr 019,

SBI_OE; addr 0D0).

Table 1-1. Hardware Signal Definitions (8 of 8)

Pin Label

Signal Name

I/O

Definition

BT8376EPF Datasheet(PDF) 27 Page - Synaptics Incorporated.

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