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TMS320C80GF Datasheet(PDF) 142 Page - Texas Instruments |
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TMS320C80GF Datasheet(HTML) 142 Page - Texas Instruments |
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142 / 171 page ![]() TMS320C80 DIGITAL SIGNAL PROCESSOR SPRS023B – JULY 1994 – REVISED OCTOBER 1997 139 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 absolute maximum ratings over specified temperature ranges (unless otherwise noted)† Supply voltage range, VDD (see Note 1) – 0.3 V to 4 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage range, VI – 0.3 V to 4 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Output voltage range – 0.3 V to 4 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating case temperature range, TC 0 °C to 85°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range, Tstg –55 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: All voltage values are with respect to VSS. recommended operating conditions MIN NOM MAX UNIT VDD Supply voltage 3.135 3.3 3.465 V VSS Supply voltage (see Note 2) 0 V IOH High-level output current – 400 µA IOL Low-level output current 2 mA TC Operating case temperature 0 85 °C NOTE 2: In order to minimize noise on VSS, care should be taken to provide a minimum inductance path between the VSS pins and system ground. electrical characteristics over recommended ranges of supply voltage and operating case temperature (unless otherwise noted) PARAMETER TEST CONDITIONS‡ MIN TYP§ MAX UNIT VIH High-level input voltage 2 VDD + 0.3 V VIL Low-level input voltage – 0.3 0.8 V VOH High-level output voltage VDD = MIN, IOH = MAX 2.6 ¶ V VOL Low-level output voltage VDD = MAX, IOH = MIN 0.6 V IO Output current, leakage (high impedance) VDD = MAX, VO = 2.8 V 20 µA IO ,g ( g ) (except EMU0 and EMU1) VDD = MAX, VO = 0.6 V – 20 µA II Input current (except TCK, TDI, and TMS) VI = VSS to VDD ±20 µA VDD = MAX, 60 MHz 1.2# 2.5# IDD Supply current (see Note 3) VDD = MAX, 50 MHz 1.0# 2.3# A VDD = MAX, 40 MHz 0.9# 1.9# Ci Input capacitance 10 pF Co Output capacitance 10 pF ‡ For conditions shown as MIN / MAX, use the appropriate value specified under the recommended operating conditions. § All typical values are at VDD = 3.3 V, ambient air temperature = 25°C ¶ Typical steady-state VOH will not exceed VDD # Parameter value is representative of revision 4.x and higher devices. NOTE 3: Maximum supply current is derived from a test case that generates the theoretical maximum data flow using a worst case checkerboard data pattern on a sustained cycle by cycle basis. Actual maximum IDD varies in real applications based on internal and external data flow and transitions. Typical supply current is derived from a test case which attempts to emulate typical use conditions of the on-chip processors with random data. Typical IDD varies from application to application based on data flow and transitions and on-chip processor utilization. |
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