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AD6684 Datasheet(PDF) 26 Page - Analog Devices |
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AD6684 Datasheet(HTML) 26 Page - Analog Devices |
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26 / 107 page ![]() AD6684 Data Sheet Rev. 0 | Page 26 of 107 CLOCK INPUT CONSIDERATIONS For optimum performance, drive the AD6684 sample clock inputs (CLK+ and CLK−) with a differential signal. This signal is typically ac-coupled to the CLK+ and CLK− pins via a transformer or clock drivers. These pins are biased internally and require no additional biasing. Figure 62 shows a preferred method for clocking the AD6684. The low jitter clock source is converted from a single-ended signal to a differential signal using an RF transformer. ADC CLK+ CLK– 0.1µF 0.1µF 100Ω 50Ω CLOCK INPUT 1:1Z Figure 62. Transformer-Coupled Differential Clock Another option is to ac couple a differential CML or LVDS signal to the sample clock input pins, as shown in Figure 63 and Figure 64. ADC CLK+ CLK– 0.1µF 0.1µF Z0 = 50Ω Z0 = 50Ω 33Ω 33Ω 71Ω 10pF 3.3V Figure 63. Differential CML Sample Clock ADC CLK+ CLK– 0.1µF 0.1µF 0.1µF 0.1µF 50Ω1 50Ω1 100Ω CLOCK INPUT LVDS DRIVER CLK+ CLK– 150Ω RESISTORS ARE OPTIONAL. CLOCK INPUT Figure 64. Differential LVDS Sample Clock Clock Duty Cycle Considerations Typical high speed ADCs use both clock edges to generate a variety of internal timing signals. The AD6684 contains an internal clock divider and a duty cycle stabilizer (DCS). In applications where the clock duty cycle cannot be guaranteed to be 50%, a higher multiple frequency clock along with the usage of the clock divider is recommended. When it is not possible to provide a higher frequency clock, it is recommended to turn on the DCS using Register 0x011C. The output of the divider offers a 50% duty cycle, high slew rate (fast edge) clock signal to the internal ADC. See the Memory Map section for more details on using this feature. Input Clock Divider The AD6684 contains an input clock divider with the ability to divide the input clock by 1, 2, 4, and 8. The divider ratios can be selected using Register 0x0108 (see Figure 65). In applications where the clock input is a multiple of the sample clock, care must be taken to program the appropriate divider ratio into the clock divider before applying the clock signal. This ratio ensures that the current transients during device startup are controlled. CLK+ CLK– ÷2 ÷4 REG 0x0108 ÷8 Figure 65. Clock Divider Circuit The AD6684 clock divider can be synchronized using the external SYSREF± input. A valid SYSREF± causes the clock divider to reset to a programmable state. This synchronization feature allows multiple devices to have their clock dividers aligned to guarantee simultaneous input sampling. Clock Jitter Considerations High speed, high resolution ADCs are sensitive to the quality of the clock input. The degradation in SNR at a given input frequency (fA) due only to aperture jitter (tJ) can be calculated by SNR = −20 × log (2 × π × fA × tJ) In this equation, the rms aperture jitter represents the root mean square of all jitter sources, including the clock input, analog input signal, and ADC aperture jitter specifications. IF undersampling applications are particularly sensitive to jitter (see Figure 66). 130 120 110 100 90 80 70 60 50 40 30 10 100 1000 10000 ANALOG INPUT FREQUENCY (MHz) 12.5 fS 25 fS 50 fS 100 fS 200 fS 400 fS 800 fS Figure 66. Ideal SNR vs. Analog Input Frequency and Jitter |
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